Lakeshore TTPX cryogenic-temperature probe station for device chips characterization before wire-bonding
·LN2 and LHe Temperature
·Integrated I-V & C-V measurements
·Agilent 4156C precision semiconductor parameter analyzer
·Agilent E4980A precision LCR meter, with frequency range from 20 hertz to 2 megahertz
·Fiber coupling laser beam for photo-response measurement
